Showing results: 16 - 30 of 134 items found.
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Teledyne LeCroy
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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PXP-500A -
Teledyne LeCroy
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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GT9000 -
Guide Technology, Inc.
GT9000 is a scalable 2 to 10 channelsBench-Top CTIA and/or TIC Test Platformwith 10” touch-screen-display (iPhone quality), integrated GUI with Touch, Ethernet, WiFi and/or wireless keyboard & mouse.
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GT9000P-USB3 -
Guide Technology, Inc.
A 2 channel Portable “CTIA” and/or “TIC” Test Platform controlled by USB3
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GT9000R -
Guide Technology, Inc.
GT9000R is a scalable 2 to 24 channels 19”Rack-Mount CTIA and/or TIC Test Platformwith integrated GUI, Ethernet, Wi-Fi and/orwireless keyboard & mouse.
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iWave Systems Technologies
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Dielectric Constant -
Materials Development Corporation
The Dielectric Constant option allows the user to measure the dielectric constant of a wide range of materials. Simply input a test voltage (in accumulation), the area (or diameter), and stray capacitance to determine the relative dielectric constant.
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HDLT -
Hention Electrical Equipment Co., Ltd.
This integrated precious insulation oil dielectric loss tester is for measuring dielectric loss TAN and capacitance of transformer insulation oil.This is a high precision instrument; integrated with oil cup, temperature control instrument, temperature sensor, dielectric loss test bridge, AC test power, and standard capacitor, etc.
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KVJS-7000 -
KV Hipot Power Test Equipment Co.,Ltd
Insulation oil dielectric loss and resistivity tester is mainly used to test dielectric loss factor and resistivity of insulation oil and liquid insulation medium.
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Vettiner
High accuracy Schering bridge for the measurement of capacitance and dielectric dissipation factor (tan d) for the characterization of dielectric insulators, calibration of standards and manufacturing test of all industrial equipment.
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ASTM D149 -
National Technical Systems
This test method covers procedures for the determination of dielectric strength of solid insulating materials at commercial power frequencies, under specified conditions. Unless otherwise specified, the tests shall be made at 60 Hz. However, this test method is suitable for use at any frequency from 25 to 800 Hz. At frequencies above 800 Hz, dielectric heating is a potential problem. This test method is intended to be used in conjunction with any ASTM standard or other document that refers to this test method. References to this document need to specify the particular options to be used. It is suitable for use at various temperatures, and in any suitable gaseous or liquid surrounding medium. This test method is not intended for measuring the dielectric strength of materials that are fluid under the conditions of test. This test method is not intended for use in determining intrinsic dielectric strength, direct-voltage dielectric strength, or thermal failure under electrical stress (see Test Method ASTM D3151). This test method is most commonly used to determine the dielectric breakdown voltage through the thickness of a test specimen (puncture). It is also suitable for use to determine dielectric breakdown voltage along the interface between a solid specimen and a gaseous or liquid surrounding medium (flashover). This test method is similar to IEC Publication 243-1. All procedures in this method are included in IEC 243-1. Differences between this method and IEC 243-1 are largely editorial. Note: The above information is taken directly from the test method Scope published in ASTM D149.
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Weshine Electric Manufacturing Co., Ltd
Insulation is one of the most important constituents of a transformer. Any weakness in the insulation may cause failure of transformer. To ensure the effectiveness of the insulation system of a transformer, it must confirms the dielectric test. But the power frequency withstand test alone can not be adequate to demonstrate the dielectric strength of a transformer.
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HT-Series -
Becker & Hickl GmbH
Dielectric Voltage Withstand Test or High Potential Test (HIPOT test) is a 100% production line test to verify the quality & electrical safety characteristics of products.
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HT-Series -
Lumetronics
Dielectric Voltage Withstand Test or High Potential Test (HIPOT test) is a 100% production line test to verify the quality & electrical safety characteristics of products.
